{"id":996842,"date":"2026-08-20T06:33:30","date_gmt":"2026-08-20T10:33:30","guid":{"rendered":"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/"},"modified":"2026-08-20T06:33:30","modified_gmt":"2026-08-20T10:33:30","slug":"qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities","status":"publish","type":"post","link":"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/","title":{"rendered":"Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities"},"content":{"rendered":"<p>        <!--.bwalignc { text-align: center; list-style-position: inside }body {font:normal small Arial,Helvetica,sans-serif;color:#000;background-color:#fff;padding:24px;margin:0;} a img {border:0;} h3 {font-size:medium;color:#000;margin:0 0 1em 0; text-align:center;}-->  <\/p>\n<p class=\"bwalignc\"><b>Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities<\/b><\/p>\n<p class=\"bwalignc\"><i>Investment sharpens process control from materials development through manufacturing<\/i><\/p>\n<p>MARLBOROUGH, Mass.&#8211;(<a href=\"http:\/\/www.businesswire.com\">BUSINESS WIRE<\/a>)&#8211;<br \/>\nQnity Electronics, Inc. (\u201cQnity\u201d) (NYSE: Q), a premier technology solutions leader across the semiconductor value chain, today announced the installation of a Surfscan<sup>\u00ae<\/sup> SP7<sup>XP<\/sup> unpatterned wafer defect inspection system from KLA as part of its ongoing investment in advanced semiconductor materials innovation. The system enhances Qnity&#8217;s ability to develop and manufacture leading-edge materials, deepening the process insight that supports customer technology roadmaps.<\/p>\n<p id=\"news-body-cta\">This press release features multimedia. View the full release here: <a href=\"https:\/\/www.businesswire.com\/news\/home\/20260819307953\/en\/\" rel=\"nofollow\">https:\/\/www.businesswire.com\/news\/home\/20260819307953\/en\/<\/a><\/p>\n<div id=\"bwbodyimg\" style=\"width: 480px;float:left;padding-left:0px;padding-right:20px;padding-top:0px;padding-bottom:0px\"><img decoding=\"async\" src=\"https:\/\/mms.businesswire.com\/media\/20260819307953\/en\/2878740\/4\/Picture1.jpg\" alt=\"James Seale (left), general manager at KLA, joins Qnity&apos;s Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography Technologies, in the fab at the Qnity New England Manufacturing &amp; Technology Center in Marlborough, Mass., following the installation of a Surfscan\u00ae SP7XP unpatterned wafer defect inspection system from KLA. The system supports Qnity&apos;s ongoing investment in advanced semiconductor materials innovation.\" \/><\/p>\n<p style=\"font-size:85%\">James Seale (left), general manager at KLA, joins Qnity&#8217;s Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography Technologies, in the fab at the Qnity New England Manufacturing &amp; Technology Center in Marlborough, Mass., following the installation of a Surfscan\u00ae SP7XP unpatterned wafer defect inspection system from KLA. The system supports Qnity&#8217;s ongoing investment in advanced semiconductor materials innovation.<\/p>\n<\/div>\n<p>\n\u201cDeveloping breakthrough materials for advanced semiconductor technologies requires deep insight into performance and quality at every stage of development and manufacturing,\u201d said Julia Woertink, VP of Technology, Semiconductor Technologies, Qnity. \u201cBy strengthening how we understand and control quality, we can help our customers push into more advanced nodes with greater confidence and speed.\u201d<\/p>\n<p>\nInstalled at Qnity&#8217;s New England Manufacturing &amp; Technology Center in Marlborough, Mass., the Surfscan SP7<sup>XP<\/sup> system is part of the company&#8217;s broader investment strategy to support advanced semiconductor innovation across its global network. It expands Qnity&#8217;s ecosystem of characterization and process control capabilities, helping teams identify sources of variation earlier in materials development and integration.<\/p>\n<p>\nAt advanced nodes, where even small defects can affect device performance, improved understanding of product and process variation supports faster process learning and scale-up for Qnity and its customers. Qnity\u2019s latest investment supports the development and reliable manufacture of <a rel=\"nofollow\" href=\"https:\/\/cts.businesswire.com\/ct\/CT?id=smartlink&amp;url=https%3A%2F%2Fwww.qnityelectronics.com%2Fsemiconductor-lithography.html&amp;esheet=54591896&amp;newsitemid=20260819307953&amp;lan=en-US&amp;anchor=advanced+lithography+materials&amp;index=1&amp;md5=f023b14596548763658fdaa99a6becef\">advanced lithography materials<\/a>, including the Epic<sup>\u00ae<\/sup> photoresist family for ArF lithography, the Eon\u2122 photoresist family for extreme ultraviolet (EUV) lithography, and enabling underlayer materials.<\/p>\n<p>\n\u201cQnity&#8217;s investment in the Surfscan SP7<sup>XP<\/sup> system reflects the growing emphasis on characterization and process control across the semiconductor value chain,\u201d said James Seale, General Manager, KLA. \u201cProcess qualification, monitoring and defect characterization are key enablers for the quality and reliability required in advanced semiconductor applications.\u201d<\/p>\n<p><b>About Qnity<br \/>\n<br \/><\/b>Qnity is a premier technology provider across the semiconductor value chain, empowering AI, high performance computing, and advanced connectivity. From groundbreaking solutions for semiconductor chip manufacturing, to enabling high-speed transmission within complex electronic systems, our high-performance materials and integration expertise make tomorrow\u2019s technologies possible. More information about the company, its businesses and solutions can be found at <a rel=\"nofollow\" href=\"https:\/\/cts.businesswire.com\/ct\/CT?id=smartlink&amp;url=http%3A%2F%2Fwww.qnityelectronics.com&amp;esheet=54591896&amp;newsitemid=20260819307953&amp;lan=en-US&amp;anchor=www.qnityelectronics.com&amp;index=2&amp;md5=09a387c160e4d458c9357b146780fe6a\">www.qnityelectronics.com<\/a>.<\/p>\n<p>\nQnity\u2122 and the Qnity Node Logo are trademarks or registered trademarks of affiliates of Qnity Electronics, Inc. Surfscan<sup>\u00ae<\/sup> is a registered trademark of KLA Corporation.<\/p>\n<p><img decoding=\"async\" alt=\"\" src=\"https:\/\/cts.businesswire.com\/ct\/CT?id=bwnews&amp;sty=20260819307953r1&amp;sid=flmnd&amp;distro=nx&amp;lang=en\" style=\"width:0;height:0\" \/><span class=\"bwct31415\" \/><\/p>\n<p id=\"mmgallerylink\"><span id=\"mmgallerylink-phrase\">View source version on businesswire.com: <\/span><span id=\"mmgallerylink-link\"><a href=\"https:\/\/www.businesswire.com\/news\/home\/20260819307953\/en\/\" rel=\"nofollow\">https:\/\/www.businesswire.com\/news\/home\/20260819307953\/en\/<\/a><\/span><\/p>\n<p><b>Media Contact<br \/>\n<\/b><br \/>Ashley Boucher<br \/>\n<br \/><a rel=\"nofollow\" href=\"mailto:ashley.boucher@qnityelectronics.com\">ashley.boucher@qnityelectronics.com<\/a><\/p>\n<p><b>KEYWORDS:<\/b> Massachusetts United States North America<\/p>\n<p><b>INDUSTRY KEYWORDS:<\/b> Semiconductor Engineering Consumer Electronics Technology Manufacturing Other Manufacturing<\/p>\n<p><b>MEDIA:<\/b><\/p>\n<table cellpadding=\"3\" cellspacing=\"3\">\n<tr>\n<td><font face=\"Arial\" size=\"2\"><b>Photo<\/b><\/font><\/td>\n<\/tr>\n<tr>\n<td><img decoding=\"async\" src=\"https:\/\/mms.businesswire.com\/media\/20260819307953\/en\/2878740\/3\/Picture1.jpg\" alt=\"Photo\" \/><\/td>\n<\/tr>\n<tr>\n<td><font face=\"Arial\" size=\"2\">James Seale (left), general manager at KLA, joins Qnity&#8217;s Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography Technologies, in the fab at the Qnity New England Manufacturing &amp; Technology Center in Marlborough, Mass., following the installation of a Surfscan\u00ae SP7XP unpatterned wafer defect inspection system from KLA. The system supports Qnity&#8217;s ongoing investment in advanced semiconductor materials innovation.<\/font><\/td>\n<\/tr>\n<tr>\n<td><font face=\"Arial\" size=\"2\"><b>Logo<\/b><\/font><\/td>\n<\/tr>\n<tr>\n<td><img decoding=\"async\" src=\"https:\/\/mms.businesswire.com\/media\/20260819307953\/en\/2624398\/3\/Qnity_logo_horizontal.jpg\" alt=\"Logo\" \/><\/td>\n<\/tr>\n<tr>\n<td><font face=\"Arial\" size=\"2\"><\/font><\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"<p>Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities Investment sharpens process control from materials development through manufacturing MARLBOROUGH, Mass.&#8211;(BUSINESS WIRE)&#8211; Qnity Electronics, Inc. (\u201cQnity\u201d) (NYSE: Q), a premier technology solutions leader across the semiconductor value chain, today announced the installation of a Surfscan\u00ae SP7XP unpatterned wafer defect inspection system from KLA as part of its ongoing investment in advanced semiconductor materials innovation. The system enhances Qnity&#8217;s ability to develop and manufacture leading-edge materials, deepening the process insight that supports customer technology roadmaps. This press release features multimedia. View the full release here: https:\/\/www.businesswire.com\/news\/home\/20260819307953\/en\/ James Seale (left), general manager at KLA, joins Qnity&#8217;s Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography &hellip; <\/p>\n<p class=\"link-more\"><a href=\"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/\" class=\"more-link\">Continue reading<span class=\"screen-reader-text\"> &#8220;Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities&#8221;<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[],"tags":[],"class_list":["post-996842","post","type-post","status-publish","format-standard","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v28.3 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities - Market Newsdesk<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities - Market Newsdesk\" \/>\n<meta property=\"og:description\" content=\"Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities Investment sharpens process control from materials development through manufacturing MARLBOROUGH, Mass.&#8211;(BUSINESS WIRE)&#8211; Qnity Electronics, Inc. (\u201cQnity\u201d) (NYSE: Q), a premier technology solutions leader across the semiconductor value chain, today announced the installation of a Surfscan\u00ae SP7XP unpatterned wafer defect inspection system from KLA as part of its ongoing investment in advanced semiconductor materials innovation. The system enhances Qnity&#8217;s ability to develop and manufacture leading-edge materials, deepening the process insight that supports customer technology roadmaps. This press release features multimedia. View the full release here: https:\/\/www.businesswire.com\/news\/home\/20260819307953\/en\/ James Seale (left), general manager at KLA, joins Qnity&#8217;s Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography &hellip; Continue reading &quot;Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities&quot;\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/\" \/>\n<meta property=\"og:site_name\" content=\"Market Newsdesk\" \/>\n<meta property=\"article:published_time\" content=\"2026-08-20T10:33:30+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/mms.businesswire.com\/media\/20260819307953\/en\/2878740\/4\/Picture1.jpg\" \/>\n<meta name=\"author\" content=\"Newsdesk\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Newsdesk\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"3 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\\\/\"},\"author\":{\"name\":\"Newsdesk\",\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/#\\\/schema\\\/person\\\/482f27a394d4fda80ecb5499e519d979\"},\"headline\":\"Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities\",\"datePublished\":\"2026-08-20T10:33:30+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\\\/\"},\"wordCount\":597,\"image\":{\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/mms.businesswire.com\\\/media\\\/20260819307953\\\/en\\\/2878740\\\/4\\\/Picture1.jpg\",\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\\\/\",\"url\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\\\/\",\"name\":\"Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities - 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(\u201cQnity\u201d) (NYSE: Q), a premier technology solutions leader across the semiconductor value chain, today announced the installation of a Surfscan\u00ae SP7XP unpatterned wafer defect inspection system from KLA as part of its ongoing investment in advanced semiconductor materials innovation. The system enhances Qnity&#8217;s ability to develop and manufacture leading-edge materials, deepening the process insight that supports customer technology roadmaps. This press release features multimedia. View the full release here: https:\/\/www.businesswire.com\/news\/home\/20260819307953\/en\/ James Seale (left), general manager at KLA, joins Qnity&#8217;s Besnik Cumani, fab equipment manager, and Drew Chambers, vice president and general manager of Lithography &hellip; Continue reading \"Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities\"","og_url":"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/","og_site_name":"Market Newsdesk","article_published_time":"2026-08-20T10:33:30+00:00","og_image":[{"url":"https:\/\/mms.businesswire.com\/media\/20260819307953\/en\/2878740\/4\/Picture1.jpg","type":"","width":"","height":""}],"author":"Newsdesk","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Newsdesk","Est. reading time":"3 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/#article","isPartOf":{"@id":"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/"},"author":{"name":"Newsdesk","@id":"https:\/\/www.marketnewsdesk.com\/#\/schema\/person\/482f27a394d4fda80ecb5499e519d979"},"headline":"Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities","datePublished":"2026-08-20T10:33:30+00:00","mainEntityOfPage":{"@id":"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/"},"wordCount":597,"image":{"@id":"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/#primaryimage"},"thumbnailUrl":"https:\/\/mms.businesswire.com\/media\/20260819307953\/en\/2878740\/4\/Picture1.jpg","inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/","url":"https:\/\/www.marketnewsdesk.com\/index.php\/qnity-accelerates-advanced-node-materials-innovation-with-next-generation-kla-inspection-capabilities\/","name":"Qnity Accelerates Advanced Node Materials Innovation with Next-Generation KLA Inspection Capabilities - 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