{"id":778428,"date":"2023-08-16T17:04:01","date_gmt":"2023-08-16T21:04:01","guid":{"rendered":"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/"},"modified":"2023-08-16T17:04:01","modified_gmt":"2023-08-16T21:04:01","slug":"aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22","status":"publish","type":"post","link":"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/","title":{"rendered":"Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1&#215;1 Conference on August 22"},"content":{"rendered":"<div class=\"mw_release\">\n<p>FREMONT, Calif., Aug.  16, 2023  (GLOBE NEWSWIRE) &#8212; <strong>Aehr Test Systems<\/strong> (<strong>NASDAQ: AEHR<\/strong>), a worldwide supplier of semiconductor test and burn-in\u00a0equipment, today announced that it will participate in the 4<sup>th<\/sup> Annual Needham Virtual Semiconductor and SemiCap 1&#215;1 Conference on Tuesday, August 22, 2023. Aehr Test President and CEO Gayn Erickson and CFO Chris Siu will be hosting virtual meetings with investors throughout the day.<\/p>\n<p>\u201cWe look forward to discussing our unique semiconductor production test and burn-in solutions and the markets they\u00a0serve with investors and shareholders,\u201d said Gayn Erickson, President and CEO of\u00a0Aehr Test Systems. \u201cAehr Test provides complete production solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, silicon photonics devices used in data centers and\u00a05G infrastructure and also for new applications such as optical input\/output (I\/O) and co-packaged optics devices that are on the horizon. Wafer level test and burn-in of these and other devices that are used in applications where quality, reliability, safety, and security are critical to the customers and the semiconductor suppliers who supply to them are significant growth drivers for Aehr Test.\u201d<\/p>\n<p>For additional information, or to schedule a virtual meeting with Aehr management, please contact your Needham representative, or Aehr\u2019s investor relations firm, MKR Investor Relations, at <a href=\"https:\/\/www.globenewswire.com\/Tracker?data=JNAEFPHGSV33TsNBvUs_3e1n0EjrXN56-E4LtAdnnZcc_Gp1KfBkRAhuyPoPXOqCBog3HYL_0cNZnmBIeXtApr0A8ZGE1YJFa8OYQM3j72Y=\" rel=\"nofollow noopener\" target=\"_blank\">aehr@mkr-group.com<\/a>.<\/p>\n<p>\n        <strong>About Aehr Test Systems<\/strong><br \/>\n        <br \/>Headquartered in Fremont, California, Aehr Test Systems is a leading provider of test solutions for testing, burning-in, and stabilizing semiconductor devices in wafer level, singulated die, and package part form, and has installed thousands of systems worldwide. Increasing quality, reliability, safety, and security needs of semiconductors used across multiple applications, including electric vehicles, electric vehicle charging infrastructure, solar and wind power, computing, data and telecommunications infrastructure, and solid-state memory and storage, are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products and solutions. Aehr has developed and introduced several innovative products including the FOX-P\u2122\u00a0families of test and burn-in systems and FOX WaferPak\u2122\u00a0Aligner, FOX WaferPak Contactor, FOX DiePak<sup>\u00ae<\/sup> Carrier and FOX DiePak Loader. The FOX-XP and FOX-NP systems are full wafer contact and singulated die\/module test and burn-in systems that can test, burn-in, and stabilize a wide range of devices such as leading-edge silicon carbide-based and other power semiconductors, 2D and 3D sensors used in mobile phones, tablets, and other computing devices, memory semiconductors, processors, microcontrollers, systems-on-a-chip, and photonics and integrated optical devices. The FOX-CP system is a low-cost single-wafer compact test solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The FOX WaferPak Contactor contains a unique full wafer contactor capable of testing wafers up to 300mm that enables IC manufacturers to perform test, burn-in, and stabilization of full wafers on the FOX-P systems. The FOX DiePak Carrier allows testing, burning in, and stabilization of singulated bare die and modules up to 1024 devices in parallel per DiePak on the FOX-NP and FOX-XP systems up to nine DiePaks at a time. For more information, please visit Aehr Test Systems\u2019 website at <a href=\"https:\/\/www.globenewswire.com\/Tracker?data=nKYneQd421N_NCy4pEEks45ylRF3rfNB_qjsHIRulBCE4YcpgCKJc4J4geEgWRU6OeVWVsGjmqgS7yfob5mcaQ==\" rel=\"nofollow noopener\" target=\"_blank\"><u>www.aehr.com<\/u><\/a>.<\/p>\n<table style=\"border-collapse: collapse;width:100%;border-collapse:collapse\">\n<tr>\n<td style=\"max-width:20%;width:20%;min-width:20%\">\n            <strong>Contacts:<\/strong>\n          <\/td>\n<td style=\"max-width:9%;width:9%;min-width:9%\">\u00a0 \u00a0 \u00a0 \u00a0 \u00a0\u00a0<\/td>\n<td style=\"max-width:71%;width:71%;min-width:71%\">\u00a0<\/td>\n<\/tr>\n<tr>\n<td style=\"vertical-align: top\">\n            <strong>Aehr Test Systems<\/strong><br \/>\n            <br \/>Chris Siu<br \/>Chief Financial Officer<br \/><a href=\"mailto:csiu@aehr.com\" rel=\"nofollow noopener\" target=\"_blank\">csiu@aehr.com<\/a><\/td>\n<td style=\"vertical-align: top\">\u00a0<\/td>\n<td style=\"vertical-align: top\">\n            <strong>MKR Investor Relations Inc.<\/strong><br \/>\n            <br \/>Todd Kehrli or Jim Byers<br \/>Analyst\/Investor Contact<br \/>(323) 468-2300<br \/><a href=\"mailto:aehr@mkr-group.com\" rel=\"nofollow noopener\" target=\"_blank\">aehr@mkr-group.com<\/a><\/td>\n<\/tr>\n<\/table>\n<p>      <img decoding=\"async\" class=\"__GNW8366DE3E__IMG\" src=\"https:\/\/www.globenewswire.com\/newsroom\/ti?nf=ODg5NjA5OSM1NzYwMjExIzIwMjA4MTA=\" \/><br \/>\n      <br \/>\n      <img decoding=\"async\" src=\"https:\/\/ml.globenewswire.com\/media\/ZGEyYzU5ZWMtZTlkMi00NjI5LWJmNDktZjkzMzkyNDNiYmIyLTEwMzIzOTI=\/tiny\/Aehr-Test-Systems.png\" \/>\n    <\/div>\n<div class=\"mw_contactinfo\"><\/div>\n","protected":false},"excerpt":{"rendered":"<p>FREMONT, Calif., Aug. 16, 2023 (GLOBE NEWSWIRE) &#8212; Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in\u00a0equipment, today announced that it will participate in the 4th Annual Needham Virtual Semiconductor and SemiCap 1&#215;1 Conference on Tuesday, August 22, 2023. Aehr Test President and CEO Gayn Erickson and CFO Chris Siu will be hosting virtual meetings with investors throughout the day. \u201cWe look forward to discussing our unique semiconductor production test and burn-in solutions and the markets they\u00a0serve with investors and shareholders,\u201d said Gayn Erickson, President and CEO of\u00a0Aehr Test Systems. \u201cAehr Test provides complete production solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, &hellip; <\/p>\n<p class=\"link-more\"><a href=\"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/\" class=\"more-link\">Continue reading<span class=\"screen-reader-text\"> &#8220;Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1&#215;1 Conference on August 22&#8221;<\/span><\/a><\/p>\n","protected":false},"author":2,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[],"tags":[],"class_list":["post-778428","post","type-post","status-publish","format-standard","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.9 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1x1 Conference on August 22 - Market Newsdesk<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1x1 Conference on August 22 - Market Newsdesk\" \/>\n<meta property=\"og:description\" content=\"FREMONT, Calif., Aug. 16, 2023 (GLOBE NEWSWIRE) &#8212; Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in\u00a0equipment, today announced that it will participate in the 4th Annual Needham Virtual Semiconductor and SemiCap 1&#215;1 Conference on Tuesday, August 22, 2023. Aehr Test President and CEO Gayn Erickson and CFO Chris Siu will be hosting virtual meetings with investors throughout the day. \u201cWe look forward to discussing our unique semiconductor production test and burn-in solutions and the markets they\u00a0serve with investors and shareholders,\u201d said Gayn Erickson, President and CEO of\u00a0Aehr Test Systems. \u201cAehr Test provides complete production solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, &hellip; Continue reading &quot;Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1&#215;1 Conference on August 22&quot;\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/\" \/>\n<meta property=\"og:site_name\" content=\"Market Newsdesk\" \/>\n<meta property=\"article:published_time\" content=\"2023-08-16T21:04:01+00:00\" \/>\n<meta property=\"og:image\" content=\"https:\/\/www.globenewswire.com\/newsroom\/ti?nf=ODg5NjA5OSM1NzYwMjExIzIwMjA4MTA=\" \/>\n<meta name=\"author\" content=\"Newsdesk\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:label1\" content=\"Written by\" \/>\n\t<meta name=\"twitter:data1\" content=\"Newsdesk\" \/>\n\t<meta name=\"twitter:label2\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data2\" content=\"3 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"Article\",\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\\\/#article\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\\\/\"},\"author\":{\"name\":\"Newsdesk\",\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/#\\\/schema\\\/person\\\/482f27a394d4fda80ecb5499e519d979\"},\"headline\":\"Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1&#215;1 Conference on August 22\",\"datePublished\":\"2023-08-16T21:04:01+00:00\",\"mainEntityOfPage\":{\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\\\/\"},\"wordCount\":555,\"image\":{\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\\\/#primaryimage\"},\"thumbnailUrl\":\"https:\\\/\\\/www.globenewswire.com\\\/newsroom\\\/ti?nf=ODg5NjA5OSM1NzYwMjExIzIwMjA4MTA=\",\"inLanguage\":\"en-US\"},{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\\\/\",\"url\":\"https:\\\/\\\/www.marketnewsdesk.com\\\/index.php\\\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\\\/\",\"name\":\"Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1x1 Conference on August 22 - 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Market Newsdesk","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/","og_locale":"en_US","og_type":"article","og_title":"Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1x1 Conference on August 22 - Market Newsdesk","og_description":"FREMONT, Calif., Aug. 16, 2023 (GLOBE NEWSWIRE) &#8212; Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor test and burn-in\u00a0equipment, today announced that it will participate in the 4th Annual Needham Virtual Semiconductor and SemiCap 1&#215;1 Conference on Tuesday, August 22, 2023. Aehr Test President and CEO Gayn Erickson and CFO Chris Siu will be hosting virtual meetings with investors throughout the day. \u201cWe look forward to discussing our unique semiconductor production test and burn-in solutions and the markets they\u00a0serve with investors and shareholders,\u201d said Gayn Erickson, President and CEO of\u00a0Aehr Test Systems. \u201cAehr Test provides complete production solutions for improving quality, reliability, and yield of semiconductors such as silicon carbide devices used in electric vehicles and charging infrastructure, &hellip; Continue reading \"Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1&#215;1 Conference on August 22\"","og_url":"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/","og_site_name":"Market Newsdesk","article_published_time":"2023-08-16T21:04:01+00:00","og_image":[{"url":"https:\/\/www.globenewswire.com\/newsroom\/ti?nf=ODg5NjA5OSM1NzYwMjExIzIwMjA4MTA=","type":"","width":"","height":""}],"author":"Newsdesk","twitter_card":"summary_large_image","twitter_misc":{"Written by":"Newsdesk","Est. reading time":"3 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"Article","@id":"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/#article","isPartOf":{"@id":"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/"},"author":{"name":"Newsdesk","@id":"https:\/\/www.marketnewsdesk.com\/#\/schema\/person\/482f27a394d4fda80ecb5499e519d979"},"headline":"Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1&#215;1 Conference on August 22","datePublished":"2023-08-16T21:04:01+00:00","mainEntityOfPage":{"@id":"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/"},"wordCount":555,"image":{"@id":"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/#primaryimage"},"thumbnailUrl":"https:\/\/www.globenewswire.com\/newsroom\/ti?nf=ODg5NjA5OSM1NzYwMjExIzIwMjA4MTA=","inLanguage":"en-US"},{"@type":"WebPage","@id":"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/","url":"https:\/\/www.marketnewsdesk.com\/index.php\/aehr-test-systems-to-participate-in-the-needham-virtual-semiconductor-and-semicap-1x1-conference-on-august-22\/","name":"Aehr Test Systems to Participate in the Needham Virtual Semiconductor\u00a0and SemiCap 1x1 Conference on August 22 - 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