{"id":453934,"date":"2021-03-09T10:33:12","date_gmt":"2021-03-09T15:33:12","guid":{"rendered":"http:\/\/www.marketnewsdesk.com\/?p=453934"},"modified":"2021-03-09T10:33:12","modified_gmt":"2021-03-09T15:33:12","slug":"dvcon-u-s-2021-announces-stuart-sutherland-best-paper-best-poster-winners-attendance-numbers","status":"publish","type":"post","link":"https:\/\/www.marketnewsdesk.com\/index.php\/dvcon-u-s-2021-announces-stuart-sutherland-best-paper-best-poster-winners-attendance-numbers\/","title":{"rendered":"DVCon U.S. 2021 Announces Stuart Sutherland Best Paper & Best Poster Winners, Attendance Numbers"},"content":{"rendered":"
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GAINESVILLE, Fla., March 09, 2021 (GLOBE NEWSWIRE) — The 2021 virtual Design and Verification Conference and Exhibition U.S. (DVCon U.S.), sponsored by Accellera Systems Initiative (Accellera), concluded its 33rd annual event last week. The 2021 Stuart Sutherland Best Paper and Poster winners, as voted on by attendees, were announced during a presentation at the close of day three of the program on Wednesday, March 3.<\/p>\n

Overall attendance for DVCon U.S., including the free keynote, panel, UVM Birds-of-a-Feather and exhibit-only attendees and all-access technical conference attendees, was 1,329.<\/p>\n

\u201cWe are very pleased with the attendance during our virtual conference this year,\u201d stated Aparna Dey, DVCon U.S. General Chair. “DVCon continues to be a resource for the practicing design and verification engineer and there were many valuable sessions to choose from. We had a record number of workshops this year, lively question and answer sessions following many of the presentations and 20 exhibitors for attendees to choose from. I would like to extend my sincere thank you to our steering committee, Conference Catalysts and Accellera for an outstanding virtual conference this year. I\u2019d also like to congratulate our paper and poster winners for their excellent presentations.\u201d<\/p>\n

The award for the Stuart Sutherland Best Paper Presentation, as voted by conference attendees, went to Ping Yeung, Mark Eslinger, and Jin Hou, Siemens EDA, for their presentation, \u201cFormal Verification Experiences: Spiral Refinement Methodology for Silicon Bug Hunt.\u201d Second place was awarded to Cliff Cummings, Stephen Donofrio and Jeff Wilcox of Paradigm Works and Heath Chambers, HMC Design Verification for their paper, “Advanced UVM, Multi-interface, Reactive Stimulus Techniques.\u201d Third place was awarded to Ioana Catalina Cristea and Dragos Dospinescu, Amiq Consulting for their paper, “Open-Source Framework for Co-Emulation Using PYNQ.”<\/p>\n

Top honors for Best Poster went to David Barahona, Motaz Thiab and Milica Orlandic, Norwegian University of Science and Technology and Isael Diaz and Joakim Urdahl, Nordic Semiconductor for their poster, \u201cImproving Software Testing Speed by 100X with System C Virtualization in IoT Devices.\u201d Second place was awarded to Gabriel Pachiana, Maxamillian Grundwald, Thomas Markwirth, and Christoph Sohrmann, Fraunhofer IIS\/EAS for their poster, \u201cAutomated Traceability of Requirements in the Verification Process of Safety-Critical Mixed-Signal Systems.\u201d Third place was awarded to Jian-Hua Yan, MediaTek Inc., and Ping Yeung, Stewart Li, and Sulabh-Kumar Khare of Siemens EDA for their poster, \u201cPreventing Glitch Nightmares on CDC Paths: The Three Witches.\u201d<\/p>\n

\u201cI\u2019d like to congratulate all of our paper and poster winners this year,\u201d stated Vanessa Cooper, DVCon U.S. Technical Program Committee Chair. “Each presenter worked very hard to bring content to our attendees that would be valuable in their day-to-day jobs, helping them to be even more successful. We had a variety of presentations on topics ranging from RISC-V to UVM, to Machine Learning and security and all were well-attended. I would also like to thank the TPC for their efforts in putting together an information rich program on a virtual platform. The committee put in a great deal of time over many months planning an outstanding 2021 technical program for our attendees.\u201d<\/p>\n

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